Invention Grant
- Patent Title: Thin film chemical analysis apparatus and analysis method using the same
- Patent Title (中): 薄膜化学分析仪及分析方法采用该方法
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Application No.: US12376034Application Date: 2007-08-02
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Publication No.: US08097450B2Publication Date: 2012-01-17
- Inventor: Jae-chern Yoo
- Applicant: Jae-chern Yoo
- Applicant Address: KR Suwon-Si
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-Si
- Agency: Staas & Halsey LLP
- Priority: KR10-2006-0073597 20060802
- International Application: PCT/KR2007/003728 WO 20070802
- International Announcement: WO2008/016271 WO 20080207
- Main IPC: C12M1/34
- IPC: C12M1/34 ; C12M3/00

Abstract:
Disclosed is a thin film chemical analysis apparatus and an analysis method using the same, which can solve the sealing problem caused by environmental factors (e.g. impact, temperature) for long circulation and storage periods, as well as can detect an analyte quickly and easily. The thin film chemical analysis apparatus includes at least one chamber adapted to store a fluid necessary for biological or biochemical analysis or to conduct a biological or biochemical reaction; channels for fluid-connection of the chambers; holes arranged between or inside the channels and connected to the channels; a rotatable body having the chambers, the channels, and the holes integrated into the body; and a burst valve having a sealing means for closing the hole and sealing a fluid in the chamber, the sealing means being torn away from the hole by centrifugal force resulting from rotation of the body and opening the hole.
Public/Granted literature
- US20090317896A1 THIN FILM CHEMICAL ANALYSIS APPARATUS AND ANALYSIS METHOD USING THE SAME Public/Granted day:2009-12-24
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