Invention Grant
- Patent Title: Mass-analysis method and mass-analysis apparatus
- Patent Title (中): 质量分析法和质量分析仪
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Application No.: US12161860Application Date: 2006-02-23
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Publication No.: US08097844B2Publication Date: 2012-01-17
- Inventor: Osamu Furuhashi , Ding Li
- Applicant: Osamu Furuhashi , Ding Li
- Applicant Address: JP Kyoto
- Assignee: Shimadzu Corporation
- Current Assignee: Shimadzu Corporation
- Current Assignee Address: JP Kyoto
- Agency: Sughrue Mion, PLLC
- International Application: PCT/JP2006/303291 WO 20060223
- International Announcement: WO2007/096970 WO 20070830
- Main IPC: H01J49/42
- IPC: H01J49/42

Abstract:
Among various ions introduced into an ion trap 1, those ions which are within a predetermined mass range including the mass-to-charge ratio of an objective ion are selected. Then, the frequency of a capturing voltage is set so that the objective ion will be captured with a high q-value, and a CID gas is introduced into the ion trap 1. An excitation voltage corresponding to the mass-to-charge ratio of the objective ion is applied to end-cap electrodes 3 and 4 to cause an oscillation of the objective ion and help dissociation of the ion by CID. The high q-value leads to a high dissociation efficiency. The application of the excitation voltage is discontinued before the low-mass ions produced by CID totally dissipate. Simultaneously with this operation, or slightly delayed therefrom, the frequency of the capturing voltage is switched so that the q-value will be lowered. Although the high q-value allows the low-mass product ions to easily dissipate during the CID process, they can be captured within an ion-trapping space 5 since the q-value is lowered when those ions still remain there. Thus, measurement of low-mass product ions can be simultaneously achieved with improvement of dissociation efficiency.
Public/Granted literature
- US20090032698A1 MASS-ANALYSIS METHOD AND MASS-ANALYSIS APPARATUS Public/Granted day:2009-02-05
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