Invention Grant
- Patent Title: Interconnect structures and methods
- Patent Title (中): 互连结构和方法
-
Application No.: US12252236Application Date: 2008-10-15
-
Publication No.: US08097955B2Publication Date: 2012-01-17
- Inventor: Bernd Zimmermann , Volker Berghof , Stefan Ruckmich , Thorsten Schedel
- Applicant: Bernd Zimmermann , Volker Berghof , Stefan Ruckmich , Thorsten Schedel
- Applicant Address: DE Munich
- Assignee: Qimonda AG
- Current Assignee: Qimonda AG
- Current Assignee Address: DE Munich
- Agent John S. Economou
- Main IPC: H01L23/48
- IPC: H01L23/48 ; H01L23/52 ; H01L29/40

Abstract:
Interconnect structures and methods are disclosed. In one embodiment, an interconnect structure includes a via extendable through a workpiece from a first side of the workpiece to a second side of the workpiece. The via is partially filled with a conductive material and has sidewalls. The interconnect structure includes a contact coupled to the conductive material in the via proximate the first side of the workpiece. The conductive material in the via comprises a recessed region comprising a landing zone proximate the second side of the workpiece.
Public/Granted literature
- US20100090317A1 Interconnect Structures and Methods Public/Granted day:2010-04-15
Information query
IPC分类: