A device includes a plurality of voltage regulators, and a test module. Each of the voltage regulators are configured to provide a regulated voltage to one of a plurality of subsystems. The test module is in communication with the voltage regulators, and is configured to perform a subsystem component inventory for each of the subsystems at a start of a power-on self-test of the device, to determine a configuration of the device. The test module is also configured to capture first voltage data for the subsystems during an idle operation, to capture second voltage data for the subsystems during a stressed operation, and to set a voltage set point for each of the regulated voltages provided by one of the voltage regulators based on the subsystem component inventory, a power requirement table, or the first and second voltage data.