Invention Grant
- Patent Title: Circuit arrangement comprising a load transistor and a measuring transistor
- Patent Title (中): 电路装置包括负载晶体管和测量晶体管
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Application No.: US12628714Application Date: 2009-12-01
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Publication No.: US08098058B2Publication Date: 2012-01-17
- Inventor: Aron Theil , Steffen Thiele
- Applicant: Aron Theil , Steffen Thiele
- Applicant Address: DE Neubiberg
- Assignee: Infineon Technologies AG
- Current Assignee: Infineon Technologies AG
- Current Assignee Address: DE Neubiberg
- Agency: Dicke, Billig & Czaja, PLLC
- Priority: DE102008059853 20081201
- Main IPC: G05F1/573
- IPC: G05F1/573 ; G05F3/26

Abstract:
One aspect is a circuit arrangement having a load current path with a load transistor having a first and a second load path terminal and a control terminal. A first measurement current path includes a measuring transistor having a first and a second load path terminal and a control terminal. The control terminals and first load path terminals of the load transistor and the measuring transistor are coupled. A first regulating circuit has a controllable resistor and is designed to drive the resistor depending on electrical potentials at the second load path terminals of the load transistor and of the measuring transistor. A current mirror circuit is coupled between the first measurement current path and a second measurement current path. A deactivation circuit is designed to deactivate the first regulating circuit depending on a current flowing through the measuring transistor.
Public/Granted literature
- US20100134086A1 CIRCUIT ARRANGEMENT COMPRISING A LOAD TRANSISTOR AND A MEASURING TRANSISTOR Public/Granted day:2010-06-03
Information query
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