Invention Grant
US08098068B2 Systems and methods for parametric mapping for correction of noise-based systematic bias of DTI metrics, using a DTI mapping phantom
有权
用于使用DTI映射模型校正DTI度量的基于噪声的系统偏差的参数映射的系统和方法
- Patent Title: Systems and methods for parametric mapping for correction of noise-based systematic bias of DTI metrics, using a DTI mapping phantom
- Patent Title (中): 用于使用DTI映射模型校正DTI度量的基于噪声的系统偏差的参数映射的系统和方法
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Application No.: US12321340Application Date: 2009-01-15
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Publication No.: US08098068B2Publication Date: 2012-01-17
- Inventor: Nathan E. Yanasak , Tom C. Hu
- Applicant: Nathan E. Yanasak , Tom C. Hu
- Applicant Address: US GA Augusta
- Assignee: Medical College of Georgia Research Institute, Inc.
- Current Assignee: Medical College of Georgia Research Institute, Inc.
- Current Assignee Address: US GA Augusta
- Agency: Gardner Groff Greenwald & Villanueva, PC
- Main IPC: G01V3/00
- IPC: G01V3/00
Abstract:
A system and method for minimizing, if not completely eliminating, the systematic bias present in an MR system used for DTI is disclosed. A test object or “phantom” of the present invention is scanned with a desired DTI protocol. The eigenvalues measured with the phantom are compared to the actual values that should have been measured, and a parametric map that links measured eigenvalues to actual eigenvalues is calculated, which is applicable to the desired protocol. Future eigenvalue measurements using this protocol can be recalibrated to actual eigenvalues using this map.
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