Invention Grant
US08098073B2 System for terminating high speed input/output buffers in an automatic test equipment environment to enable external loopback testing
失效
用于在自动测试设备环境中终止高速输入/输出缓冲器的系统，以实现外部环回测试
- Patent Title: System for terminating high speed input/output buffers in an automatic test equipment environment to enable external loopback testing
- Patent Title (中): 用于在自动测试设备环境中终止高速输入/输出缓冲器的系统，以实现外部环回测试
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Application No.: US11862451Application Date: 2007-09-27
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Publication No.: US08098073B2Publication Date: 2012-01-17
- Inventor: Derrick Sai-Tang Butt , Hong-Him Lim , David Carkeek
- Applicant: Derrick Sai-Tang Butt , Hong-Him Lim , David Carkeek
- Applicant Address: US CA Milpitas
- Assignee: LSI Corporation
- Current Assignee: LSI Corporation
- Current Assignee Address: US CA Milpitas
- Agent Christopher P. Maiorana, PC
- Main IPC: G01R31/02
- IPC: G01R31/02
Abstract:
An apparatus comprising a test termination card having a first set of connections and a second set of connections. The first set of connections may be configured to connect to a specific pinout of a device under test. The second set of connections may be configured to connect to a general pinout of a tester load board. The termination card may toggle between (a) connecting the first set of connectors to the second set of connectors to implement a first test type and (b) disconnecting the first set of connectors from the second set of connectors to implement a second test type.
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