Invention Grant
- Patent Title: Testing method for electronic apparatus
- Patent Title (中): 电子仪器测试方法
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Application No.: US12625865Application Date: 2009-11-25
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Publication No.: US08098075B2Publication Date: 2012-01-17
- Inventor: Tao-Cheng Yen
- Applicant: Tao-Cheng Yen
- Applicant Address: CN Guangzhou TW Taipei
- Assignee: Silitek Electronic (Guangzhou) Co., Ltd.,Lite-On Technology Corporation
- Current Assignee: Silitek Electronic (Guangzhou) Co., Ltd.,Lite-On Technology Corporation
- Current Assignee Address: CN Guangzhou TW Taipei
- Agency: Li & Cai Intellectual Property (USA) Office
- Priority: CN200910041275 20090716
- Main IPC: G01R31/14
- IPC: G01R31/14 ; G01R31/00

Abstract:
An electronic apparatus includes a first power contact, a second power contact, and a control unit. The first power contact is electrically connected with an anode of a power supply source, and the second power contact is electrically connected with a cathode of the power supply source. The control unit electrically connects the first power contact and the second power contact for forming a signal transmission path and receiving the power generated by the power supply source. When the control unit is operated in a testing mode, the control unit operates in a working mode or a sleeping mode according to an instruction of a default instruction set for changing a current waveform signal transmitted over the signal transmission path, so as to achieve the purpose of providing a convenient and high-efficiency testing.
Public/Granted literature
- US20110012611A1 TESTING METHOD FOR ELECTRONIC APPARATUS Public/Granted day:2011-01-20
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