Invention Grant
US08098075B2 Testing method for electronic apparatus 有权
电子仪器测试方法

Testing method for electronic apparatus
Abstract:
An electronic apparatus includes a first power contact, a second power contact, and a control unit. The first power contact is electrically connected with an anode of a power supply source, and the second power contact is electrically connected with a cathode of the power supply source. The control unit electrically connects the first power contact and the second power contact for forming a signal transmission path and receiving the power generated by the power supply source. When the control unit is operated in a testing mode, the control unit operates in a working mode or a sleeping mode according to an instruction of a default instruction set for changing a current waveform signal transmitted over the signal transmission path, so as to achieve the purpose of providing a convenient and high-efficiency testing.
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