There is disclosed a test head device for testing the functionality of a large number of RFID chips arranged in smart labels (17) within a smart label production apparatus by means of a data reading and/or data writing process, wherein the smart labels (17), each comprising a first antenna (10a-10e), are placed next to and behind one another on a common continuously moving strip, wherein the test head device comprises a plurality of test systems which function independently of one another, each of said test systems consisting of a write and/or read unit (12a-e), a second antenna (3, 11a-e; 18) connected thereto which is in each case assigned to one of the first antennas (10a-10e) for simultaneously transmitting read and/or write data between the first and second antennas (10a-10e; 3; 11a-e; 18) by means of ultrahigh frequency waves, and a common table unit which can be displaced at least in the height direction, wherein the second antennas (3; 11a-e; 18) are arranged on a common antenna carrier plate (2) oriented parallel to the strip.