Invention Grant
- Patent Title: Nonvolatile memory device using variable resistive element
- Patent Title (中): 使用可变电阻元件的非易失性存储器件
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Application No.: US12476875Application Date: 2009-06-02
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Publication No.: US08098518B2Publication Date: 2012-01-17
- Inventor: Hye-Jin Kim , Byung-Gil Choi , Du-Eung Kim
- Applicant: Hye-Jin Kim , Byung-Gil Choi , Du-Eung Kim
- Applicant Address: KR Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Gyeonggi-do
- Agency: Myers Bigel Sibley & Sajovec, P.A.
- Priority: KR10-2008-0052281 20080603
- Main IPC: G11C11/00
- IPC: G11C11/00

Abstract:
A nonvolatile memory device may include a memory cell array with a plurality of nonvolatile memory cells arranged in an array of rows and columns. Each of a plurality of bit lines may be coupled to nonvolatile memory cells in a respective one of the columns of the array, and each of a plurality of column selection switches may be coupled to a respective one of the bit lines. A column decoder may be coupled to the plurality of column selection switches, and the column decoder may be configured to select a first one of the bit lines using a first column selection signal having a first signal level applied to a first one of the column selection switches. The column decoder may be further configured to select a second one of the bit lines using a second column selection signal having a second signal level applied to a second one of the column selection switches with the second signal level being different than the first signal level.
Public/Granted literature
- US20090296459A1 Nonvolatile Memory Device Using Variable Resistive Element Public/Granted day:2009-12-03
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