Invention Grant
US08098795B2 Device and method for time-delayed integration on an X-ray detector composed of a plurality of detector modules
有权
在由多个检测器模块组成的X射线检测器上进行时间延迟积分的装置和方法
- Patent Title: Device and method for time-delayed integration on an X-ray detector composed of a plurality of detector modules
- Patent Title (中): 在由多个检测器模块组成的X射线检测器上进行时间延迟积分的装置和方法
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Application No.: US12569376Application Date: 2009-09-29
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Publication No.: US08098795B2Publication Date: 2012-01-17
- Inventor: Tristan Nowak , Willi A. Kalender , Harry Schilling
- Applicant: Tristan Nowak , Willi A. Kalender , Harry Schilling
- Applicant Address: DE Erlangen
- Assignee: Friedrich-Alexander-Universität Erlangen-Nürnberg
- Current Assignee: Friedrich-Alexander-Universität Erlangen-Nürnberg
- Current Assignee Address: DE Erlangen
- Agency: Meyertons, Hood, Kivlin, Kowert & Goetzel, P.C.
- Agent Eric B. Meyertons
- Main IPC: H05G1/64
- IPC: H05G1/64

Abstract:
An X-ray detector for recording an image of an object that is moving relative to the detector includes a plurality of detector modules which are adjacently disposed so that they partially overlap. Using the detector modules, a TDI (Time Delayed Integration) is performed within each detector module. Subsequently an evaluation unit determines corrected measurement values of an overlap region by adding the measured values from the individual detector modules in the overlap region.
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