Invention Grant
- Patent Title: Self-service circuit testing systems and methods
- Patent Title (中): 自助电路测试系统和方法
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Application No.: US11616608Application Date: 2006-12-27
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Publication No.: US08098797B2Publication Date: 2012-01-17
- Inventor: Yiming Wang , Lauren B. Adelson , David J. Buie , Colleen Davis , Peter C. Serubo , Roland J. Zito-Wolf
- Applicant: Yiming Wang , Lauren B. Adelson , David J. Buie , Colleen Davis , Peter C. Serubo , Roland J. Zito-Wolf
- Applicant Address: US NJ Basking Ridge
- Assignee: Verizon Patent and Licensing Inc.
- Current Assignee: Verizon Patent and Licensing Inc.
- Current Assignee Address: US NJ Basking Ridge
- Main IPC: H04M1/24
- IPC: H04M1/24 ; H04M3/08 ; H04M3/22

Abstract:
In one of many possible embodiments, an exemplary system includes a test management subsystem configured to provide a user portal to a user of a circuit provided by a service provider, the user portal including a tool enabling the user to select a signal loop for testing at least a section of the circuit, the signal loop being selected from a plurality of signal loop options. The system also includes a network management subsystem communicatively coupled to the test management subsystem, the network management subsystem being configured to receive data representative of the selection from the test management subsystem and instruct, based on the selection, a network device along the circuit to execute a loop-back mode. In certain embodiments, the selected signal loop defines a test pattern signal flow for testing a subsection of the circuit.
Public/Granted literature
- US20080162678A1 SELF-SERVICE CIRCUIT TESTING SYSTEMS AND METHODS Public/Granted day:2008-07-03
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