Invention Grant
US08099190B2 Apparatus and method for transferring two or more wafers whereby the positions of the wafers can be measured 有权
用于传送两个或更多个晶片的装置和方法,由此可以测量晶片的位置

Apparatus and method for transferring two or more wafers whereby the positions of the wafers can be measured
Abstract:
A method and an apparatus for transferring a substantially flat and substantially circular objects, such as wafers, from a pick-up position to a delivery position, the apparatus comprising, a manipulator, at least one source for emitting a source signal, at least one sensor for sensing said source signal and for providing a sensor signal, a computing device arranged for processing at least one sensor signal to obtain data on the position of said object, the manipulator being arranged for simultaneously transferring a first and a second object along a path in a substantially parallel orientation, spaced apart from each other, and substantially co-axially whereby the central axis of each object may be displaced radially, a said source and a said sensor are connected by a virtual line, whereby the virtual line includes an angle with the central axes of the first and second objects.
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