Invention Grant
US08099190B2 Apparatus and method for transferring two or more wafers whereby the positions of the wafers can be measured
有权
用于传送两个或更多个晶片的装置和方法,由此可以测量晶片的位置
- Patent Title: Apparatus and method for transferring two or more wafers whereby the positions of the wafers can be measured
- Patent Title (中): 用于传送两个或更多个晶片的装置和方法,由此可以测量晶片的位置
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Application No.: US11821538Application Date: 2007-06-22
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Publication No.: US08099190B2Publication Date: 2012-01-17
- Inventor: Christianus Gerardus Maria De Ridder , Theodorus Gerardus Maria Oosterlaken
- Applicant: Christianus Gerardus Maria De Ridder , Theodorus Gerardus Maria Oosterlaken
- Applicant Address: NL Bilthoven
- Assignee: ASM International N.V.
- Current Assignee: ASM International N.V.
- Current Assignee Address: NL Bilthoven
- Agency: Weingarten, Schurgin, Gagnebin & Lebovici LLP
- Main IPC: G06F19/00
- IPC: G06F19/00 ; G06F7/00 ; G01N21/86 ; G01V8/00

Abstract:
A method and an apparatus for transferring a substantially flat and substantially circular objects, such as wafers, from a pick-up position to a delivery position, the apparatus comprising, a manipulator, at least one source for emitting a source signal, at least one sensor for sensing said source signal and for providing a sensor signal, a computing device arranged for processing at least one sensor signal to obtain data on the position of said object, the manipulator being arranged for simultaneously transferring a first and a second object along a path in a substantially parallel orientation, spaced apart from each other, and substantially co-axially whereby the central axis of each object may be displaced radially, a said source and a said sensor are connected by a virtual line, whereby the virtual line includes an angle with the central axes of the first and second objects.
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