Invention Grant
US08099299B2 System and method for mapping structural and functional deviations in an anatomical region
有权
用于在解剖学区域映射结构和功能偏差的系统和方法
- Patent Title: System and method for mapping structural and functional deviations in an anatomical region
- Patent Title (中): 用于在解剖学区域映射结构和功能偏差的系统和方法
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Application No.: US12123824Application Date: 2008-05-20
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Publication No.: US08099299B2Publication Date: 2012-01-17
- Inventor: Saad Ahmed Sirohey , Gopal B. Avinash , Fausto J. Espinal , Zhongmin Lin , Ananth Mohan
- Applicant: Saad Ahmed Sirohey , Gopal B. Avinash , Fausto J. Espinal , Zhongmin Lin , Ananth Mohan
- Applicant Address: US NY Schenectady
- Assignee: General Electric Company
- Current Assignee: General Electric Company
- Current Assignee Address: US NY Schenectady
- Agency: Fletcher Yoder, P.C.
- Main IPC: G06Q10/00
- IPC: G06Q10/00 ; A61B5/05 ; G06K9/00 ; H04N15/00

Abstract:
A data processing technique is provided. In one embodiment, a computer-implemented method includes accessing individual patient deviation maps indicative of a structural difference and a functional difference, respectively, of at least one anatomical region of a patient with respect to standardized reference image data. The method may also include generating a composite patient deviation map indicative of both the structural difference and the functional difference based on at least the individual patient deviation maps, and outputting the composite patient deviation map. Additional methods, systems, and manufactures are also disclosed.
Public/Granted literature
- US20090292551A1 System and Method for Mapping Structural and Functional Deviations in an Anatomical Region Public/Granted day:2009-11-26
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