Invention Grant
- Patent Title: Verification test failure analysis
- Patent Title (中): 验证测试失败分析
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Application No.: US12362672Application Date: 2009-01-30
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Publication No.: US08099698B2Publication Date: 2012-01-17
- Inventor: Joseph Leroy Larabell
- Applicant: Joseph Leroy Larabell
- Applicant Address: US OR Wilsonville
- Assignee: Mentor Graphics Corporation
- Current Assignee: Mentor Graphics Corporation
- Current Assignee Address: US OR Wilsonville
- Agent Richard A. Dyer
- Main IPC: G06F17/50
- IPC: G06F17/50
Abstract:
Methods and apparatuses are provided that allow for efficient analysis of a graph describing tests, elements of a device design and test results. In various implementations of the invention, a relationship between the elements of a device design, and test results is performed. An entropy value is determined for each corresponding element based upon the test results. The entropy value may assist test engineers in identifying the elements of the device design needing redesign.
Public/Granted literature
- US20100199242A1 Verification Test Failure Analysis Public/Granted day:2010-08-05
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