Invention Grant
- Patent Title: High current precision resistance measurement system
- Patent Title (中): 大电流精密电阻测量系统
-
Application No.: US12240191Application Date: 2008-09-29
-
Publication No.: US08106669B2Publication Date: 2012-01-31
- Inventor: Andre C Perras , Mark Evans
- Applicant: Andre C Perras , Mark Evans
- Applicant Address: CA Smiths Falls
- Assignee: Guildline Instruments Limited
- Current Assignee: Guildline Instruments Limited
- Current Assignee Address: CA Smiths Falls
- Agent Trevor C. Klotz, Regn
- Main IPC: G01R27/08
- IPC: G01R27/08
Abstract:
A resistance testing apparatus makes use of a modular design for cascaded, parallel, bipolar current sources to obviate the need for electromechanical or pneumatic switching systems.
Public/Granted literature
- US20090085587A1 HIGH CURRENT PRECISION RESISTANCE MEASUREMENT SYSTEM Public/Granted day:2009-04-02
Information query
