According to one embodiment, a substrate inspection apparatus includes a probe socket, a probe pin, and an adaptor. The probe socket is fixed to an inspection jig on which a substrate is provided, one end of the probe socket being connected to a processor. The probe pin is attached to the other end portion of the probe socket, includes a tip shape conforming to an inspection point of the substrate with which the probe pin is in contact, and including at least one of a projection and a groove designed to specify the tip shape on a side on which the probe pin is attached to the probe socket. The adaptor is attached to the other end portion of the probe socket, and including a through hole formed in conformity with the shape of the side on which the probe pin is attached to the probe socket.