Invention Grant
- Patent Title: Catadioptric optical system for scatterometry
- Patent Title (中): 反折射光学系统用于散射测量
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Application No.: US12608654Application Date: 2009-10-29
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Publication No.: US08107173B2Publication Date: 2012-01-31
- Inventor: Yevgeniy Konstanitinovich Shmarev , Stanislav Y. Smirnov , Irina I. Pozhinskaya
- Applicant: Yevgeniy Konstanitinovich Shmarev , Stanislav Y. Smirnov , Irina I. Pozhinskaya
- Applicant Address: NL Veldhoven
- Assignee: ASML Holding N.V.
- Current Assignee: ASML Holding N.V.
- Current Assignee Address: NL Veldhoven
- Agency: Sterne, Kessler, Goldstein & Fox P.L.L.C.
- Main IPC: G02B17/00
- IPC: G02B17/00 ; G02B21/00 ; G02B23/00

Abstract:
A catadioptric optical system having a high numerical aperture operates in a wide spectral range. The catadioptric system includes a correcting plate and an optical system. The correcting plate conditions electromagnetic radiation to correct at least one aberration. The optical system reflects a first portion of the conditioned electromagnetic radiation, refracts a second portion of the conditioned electromagnetic radiation, and focuses the reflected first portion of the conditioned electromagnetic radiation onto a target portion of a substrate. The first portion of the electromagnetic radiation is not refracted by an optical element, allowing the catadioptric optical system to operate in a broad spectral range.
Public/Granted literature
- US20100046092A1 Catadioptric Optical System for Scatterometry Public/Granted day:2010-02-25
Information query
IPC分类:
G | 物理 |
G02 | 光学 |
G02B | 光学元件、系统或仪器 |
G02B17/00 | 有或无折射元件的具有反射面的系统 |