Invention Grant
US08107178B2 Storage apparatus, method of detecting failure in head of storage apparatus, and storage medium storing failure detection program
失效
存储装置,存储装置头部检测故障的方法以及存储故障检测程序的存储介质
- Patent Title: Storage apparatus, method of detecting failure in head of storage apparatus, and storage medium storing failure detection program
- Patent Title (中): 存储装置,存储装置头部检测故障的方法以及存储故障检测程序的存储介质
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Application No.: US11901544Application Date: 2007-09-18
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Publication No.: US08107178B2Publication Date: 2012-01-31
- Inventor: Tsuyoshi Takahashi
- Applicant: Tsuyoshi Takahashi
- Applicant Address: JP Tokyo
- Assignee: Toshiba Storage Device Corporation
- Current Assignee: Toshiba Storage Device Corporation
- Current Assignee Address: JP Tokyo
- Agency: Greer, Burns & Crain, Ltd.
- Priority: JP2006-349424 20061226
- Main IPC: G11B5/09
- IPC: G11B5/09

Abstract:
According to one embodiment, a storage apparatus includes: a read section that receives a predetermined electrical parameter to read out data from a recording medium; a characteristic detection section that detects a plurality of characteristic values corresponding to a plurality of different predetermined electrical parameters received by the read section, respectively, the characteristic values being predetermined indicators of the read section, respectively; a characteristic relation acquisition section that acquires a slope of a characteristic value versus a predetermined electrical parameter from the predetermined electrical parameters and the characteristic values; and a determination section that determines presence/absence of failure in the read section based on the slope acquired by the characteristic relation acquisition section.
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