Invention Grant
US08108176B2 Method and apparatus for verifying two dimensional mark quality 有权
用于验证二维标记质量的方法和装置

Method and apparatus for verifying two dimensional mark quality
Abstract:
A method and system for applying a two dimensional mark on a first surface of a component and assessing mark quality, the method including the steps of positioning a component with a first surface at a first station, applying a two dimensional mark to the first surface at the first station wherein the applied mark is intended to codify a first information subset, obtaining an image of the applied two dimensional mark at the first station, performing a mark quality assessment on the obtained image and performing a secondary function as a result of the mark quality assessment.
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