Invention Grant
- Patent Title: Code-coverage guided prioritized test generation
- Patent Title (中): 代码覆盖引导优先测试生成
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Application No.: US10953849Application Date: 2004-09-29
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Publication No.: US08108826B2Publication Date: 2012-01-31
- Inventor: Juan Jenny Li , David Mandel Weiss , Howell Stephen Yee
- Applicant: Juan Jenny Li , David Mandel Weiss , Howell Stephen Yee
- Applicant Address: US NJ Basking Ridge
- Assignee: Avaya Inc.
- Current Assignee: Avaya Inc.
- Current Assignee Address: US NJ Basking Ridge
- Main IPC: G06F9/44
- IPC: G06F9/44 ; G06F9/45

Abstract:
A method for generating test cases for a program is disclosed. The method combines features of path-oriented and goal-oriented software testing. The illustrative embodiment constructs a control-flow graph with nodes that correspond to invocations of subroutines, and constructs control-flow graphs for the source code of such nodes as well. A metric that is based on the topology of the control-flow graph is evaluated recursively for nodes of the graph and for control-flow graphs that correspond to invoked subroutines. In the illustrative embodiment, the metric employed is the length of a shortest path from the starting node to a particular node. A node n with the highest metric value is then selected as a goal, and a path from the starting node to the ending node that passes through node n is generated via backtracking.
Public/Granted literature
- US20060070048A1 Code-coverage guided prioritized test generation Public/Granted day:2006-03-30
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