Invention Grant
US08110413B2 Mask pattern verification apparatus, mask pattern verification method and method of fabricating a semiconductor device
有权
掩模图案验证装置,掩模图案验证方法以及制造半导体器件的方法
- Patent Title: Mask pattern verification apparatus, mask pattern verification method and method of fabricating a semiconductor device
- Patent Title (中): 掩模图案验证装置,掩模图案验证方法以及制造半导体器件的方法
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Application No.: US12880487Application Date: 2010-09-13
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Publication No.: US08110413B2Publication Date: 2012-02-07
- Inventor: Chikaaki Kodama , Takanori Urakami , Nozomu Furuta , Shunsuke Kagaya
- Applicant: Chikaaki Kodama , Takanori Urakami , Nozomu Furuta , Shunsuke Kagaya
- Agency: Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
- Priority: JPP2009-235982 20091013
- Main IPC: H01L21/00
- IPC: H01L21/00 ; G06F19/00 ; H01R43/00

Abstract:
In one embodiment, a mask pattern verification apparatus is disclosed. The mask pattern verification apparatus can include a library registration portion registered a clean circuit pattern, a memory portion saved a design circuit pattern, a verification circuit pattern, a verification mask pattern, and a verification wafer pattern, a mask verification portion performing mask verification to the verification mask pattern, a lithography verification portion performing lithography verification to the verification wafer pattern, and a CPU including a library registration circuit registering the clean circuit pattern to the library registration portion, a pattern matching circuit verifying the clean circuit pattern being set or not in the design circuit pattern, a verification pattern extraction circuit extracting the verification circuit pattern from the design circuit pattern, an OPC circuit performing OPC to the verification circuit pattern, a mask verification circuit controlling the mask verification portion, and a lithography verification circuit controlling the lithography verification portion.
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