Invention Grant
- Patent Title: Method of fabricating an organic thin film transistor and method of surface treatment for gate insulating layer
- Patent Title (中): 制造有机薄膜晶体管的方法和栅极绝缘层的表面处理方法
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Application No.: US12656331Application Date: 2010-01-26
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Publication No.: US08110433B2Publication Date: 2012-02-07
- Inventor: Cheng Wei Chou , Hsiao Wen Zan , Jenn-Chang Hwang , Chung Hwa Wang , Li Shiuan Tsai , Wen Chieh Wang
- Applicant: Cheng Wei Chou , Hsiao Wen Zan , Jenn-Chang Hwang , Chung Hwa Wang , Li Shiuan Tsai , Wen Chieh Wang
- Applicant Address: TW Hsinchu
- Assignee: National Tsing Hua University
- Current Assignee: National Tsing Hua University
- Current Assignee Address: TW Hsinchu
- Agency: Bacon & Thomas, PLLC
- Priority: TW98134109A 20091008
- Main IPC: H01L21/40
- IPC: H01L21/40

Abstract:
A method of fabricating an organic thin film transistor is disclosed, which comprises steps of (S1) forming a gate electrode on a substrate; (S2) forming a gate insulating layer on the gate electrode; (S3) providing a gas on the surface of the gate insulating layer to form hydrophobic molecules on the surface of the gate insulating layer; (S4) forming an organic semiconductor layer, a source electrode, and a drain electrode over the gate insulating layer having hydrophobic molecules thereon, wherein the gas of step (S3) is at least one selected from the group consisting of halogen-substituted hydrocarbon, un-substituted hydrocarbon, and the mixtures thereof. The method of the present invention utilizes gases comprising carbon or fluorine atom to perform surface treatment on the surface of the gate insulating layer, therefore the hydrophobic character of the surface of the gate insulating layer can be enhanced and the electrical properties of the OTFT can be improved. Also, a method of surface treatment for the gate insulating layer is disclosed.
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