Invention Grant
- Patent Title: Fabrication of germanium nanowire transistors
- Patent Title (中): 锗纳米线晶体管的制造
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Application No.: US12762585Application Date: 2010-04-19
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Publication No.: US08110458B2Publication Date: 2012-02-07
- Inventor: Been-Yih Jin , Jack T. Kavalieros , Matthew V. Metz , Marko Radosavlievic , Robert S. Chau
- Applicant: Been-Yih Jin , Jack T. Kavalieros , Matthew V. Metz , Marko Radosavlievic , Robert S. Chau
- Applicant Address: US CA Santa Clara
- Assignee: Intel Corporation
- Current Assignee: Intel Corporation
- Current Assignee Address: US CA Santa Clara
- Agency: Ryder, Lu, Mazzeo and Konieczny, LLC
- Agent Douglas J. Ryder
- Main IPC: H01L21/336
- IPC: H01L21/336

Abstract:
In general, in one aspect, a method includes using the Germanium nanowire as building block for high performance logic, memory and low dimensional quantum effect devices. The Germanium nanowire channel and the SiGe anchoring regions are formed simultaneously through preferential Si oxidation of epitaxial Silicon Germanium epi layer. The placement of the germanium nanowires is accomplished using a Si fin as a template and the germanium nanowire is held on Si substrate through SiGe anchors created by masking the two ends of the fins. High dielectric constant gate oxide and work function metals wrap around the Germanium nanowire for gate-all-around electrostatic channel on/off control, while the Germanium nanowire provides high carrier mobility in the transistor channel region. The germanium nanowire transistors enable high performance, low voltage (low power consumption) operation of logic and memory devices.
Public/Granted literature
- US20100200835A1 FABRICATION OF GERMANIUM NANOWIRE TRANSISTORS Public/Granted day:2010-08-12
Information query
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