Invention Grant
US08110470B2 Asymmetrical transistor device and method of fabrication 有权
非对称晶体管器件及其制造方法

Asymmetrical transistor device and method of fabrication
Abstract:
Embodiments of the invention provide an asymmetrical transistor device comprising a semiconductor substrate, a source region, a drain region and a channel region. The channel region is provided between the source and drain regions, the source, drain and channel regions being provided in the substrate. The device has a layer of a buried insulating medium provided below the source region and not below the drain region thereby forming an asymmetrical structure. The layer of buried insulating medium is provided in abutment with a lower surface of the source region.
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