Invention Grant
US08111066B2 Device and method for measuring the mass of a magnetic material, and analysis apparatus including such device 有权
用于测量磁性材料质量的装置和方法,以及包括这种装置的分析装置

  • Patent Title: Device and method for measuring the mass of a magnetic material, and analysis apparatus including such device
  • Patent Title (中): 用于测量磁性材料质量的装置和方法,以及包括这种装置的分析装置
  • Application No.: US12532672
    Application Date: 2008-03-20
  • Publication No.: US08111066B2
    Publication Date: 2012-02-07
  • Inventor: Luc Lenglet
  • Applicant: Luc Lenglet
  • Applicant Address: CY
  • Assignee: Magnisense Technology Limited
  • Current Assignee: Magnisense Technology Limited
  • Current Assignee Address: CY
  • Agency: Cantor Colburn LLP
  • Priority: FR0702134 20070323
  • International Application: PCT/FR2008/050486 WO 20080320
  • International Announcement: WO2008/132383 WO 20081106
  • Main IPC: G01R33/00
  • IPC: G01R33/00
Device and method for measuring the mass of a magnetic material, and analysis apparatus including such device
Abstract:
The invention relates to a device for measuring the mass of a magnetic material (6) present in an analysis medium, that comprises: a modulator (24) of the phase of a high-frequency and/or low-frequency component of a magnetic field for exciting the analysis medium with a modulation signal having a value that is modified by a frequency fmod; and a demodulator (36) capable of demodulating the amplitude of an amplitude signal, measured in response to the excitation field, from the modulation signal, wherein said demodulator is connected to the output of a filter (34) and to the input of an estimation unit (44).
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