Invention Grant
- Patent Title: Testing device
- Patent Title (中): 测试装置
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Application No.: US12192126Application Date: 2008-08-15
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Publication No.: US08111073B2Publication Date: 2012-02-07
- Inventor: Po-Yu Lin , Chao-Chien Lee
- Applicant: Po-Yu Lin , Chao-Chien Lee
- Applicant Address: TW Tu-Cheng, New Taipei
- Assignee: Hon Hai Precision Industry Co., Ltd.
- Current Assignee: Hon Hai Precision Industry Co., Ltd.
- Current Assignee Address: TW Tu-Cheng, New Taipei
- Agency: Altis Law Group, Inc.
- Priority: TW96130603A 20070817
- Main IPC: H01H31/02
- IPC: H01H31/02

Abstract:
A testing device (100) includes a main body (20) for supplying power to an electronic product including a space capable of assembling a battery therein, and a housing (10). The main body includes a fixing member (22) and a moving member (24) movable relative to the fixing member. The housing includes a plurality of supporting posts (14) for supporting the main body and at least one driving post (18) for driving the moving member to move relative to the fixing member. When the testing device is in standby mode, a length of the main body is shorter than that of the battery of the electronic product; when the testing device is performing its testing process, the length of the main body is equal to that of the battery of the electronic product.
Public/Granted literature
- US20090045819A1 TESTING DEVICE Public/Granted day:2009-02-19
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