Invention Grant
US08111084B2 Impedance calibration circuit and semiconductor apparatus using the same 有权
阻抗校准电路及使用其的半导体装置

Impedance calibration circuit and semiconductor apparatus using the same
Abstract:
An impedance calibration circuit includes: a first calibration unit configured to compare a first converted voltage obtained by converting a first calibration signal with a reference voltage and vary the first calibration signal; a voltage detection unit configured to activate a voltage detection signal according to a level of a power supply voltage; a multiplexing unit configured to select and output the reference voltage or the first converted voltage in response to the detection signal; and a second calibration unit configured to compare a second converted voltage obtained by converting a second calibration signal with the level of the output signal of the multiplexing unit and vary the second calibration signal.
Information query
Patent Agency Ranking
0/0