Invention Grant
- Patent Title: Impedance calibration circuit and semiconductor apparatus using the same
- Patent Title (中): 阻抗校准电路及使用其的半导体装置
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Application No.: US12846199Application Date: 2010-07-29
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Publication No.: US08111084B2Publication Date: 2012-02-07
- Inventor: Ki Ho Kim
- Applicant: Ki Ho Kim
- Applicant Address: KR Gyeonggi-do
- Assignee: Hynix Semiconductor Inc.
- Current Assignee: Hynix Semiconductor Inc.
- Current Assignee Address: KR Gyeonggi-do
- Agency: William Park & Associates Ltd.
- Priority: KR10-2010-0040548 20100430
- Main IPC: H03K19/003
- IPC: H03K19/003

Abstract:
An impedance calibration circuit includes: a first calibration unit configured to compare a first converted voltage obtained by converting a first calibration signal with a reference voltage and vary the first calibration signal; a voltage detection unit configured to activate a voltage detection signal according to a level of a power supply voltage; a multiplexing unit configured to select and output the reference voltage or the first converted voltage in response to the detection signal; and a second calibration unit configured to compare a second converted voltage obtained by converting a second calibration signal with the level of the output signal of the multiplexing unit and vary the second calibration signal.
Public/Granted literature
- US20110267140A1 IMPEDANCE CALIBRATION CIRCUIT AND SEMICONDUCTOR APPARATUS USING THE SAME Public/Granted day:2011-11-03
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