Invention Grant
- Patent Title: Calibration method and related calibration apparatus for capacitor array
- Patent Title (中): 电容阵列校准方法及相关校准装置
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Application No.: US12626629Application Date: 2009-11-26
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Publication No.: US08111178B2Publication Date: 2012-02-07
- Inventor: Chieh-Wei Liao , Chia-Hua Chou , Tse-Hsiang Hsu , Wen-Hua Chang
- Applicant: Chieh-Wei Liao , Chia-Hua Chou , Tse-Hsiang Hsu , Wen-Hua Chang
- Applicant Address: TW Hsin-Chu
- Assignee: Mediatek Inc.
- Current Assignee: Mediatek Inc.
- Current Assignee Address: TW Hsin-Chu
- Agent Winston Hsu; Scott Margo
- Main IPC: H03M1/10
- IPC: H03M1/10

Abstract:
A capacitor array includes a plurality of capacitor components each having a first node and a second node, and first nodes of the capacitor components are coupled to each other. A calibration method for the capacitor array utilizes a calibration capacitor component to couple the first nodes. Then, the calibration method determines a capacitance indication value regarding the specific capacitor component by coupling different references voltage to a second node of the specific capacitor component and coupling different test voltages to a second node of the calibration capacitor component. Accordingly, the calibration method calibrates the capacitance mismatches of the capacitor array in the digital domain.
Public/Granted literature
- US20110122006A1 CALIBRATION METHOD AND RELATED CALIBRATION APPARATUS FOR CAPACITOR ARRAY Public/Granted day:2011-05-26
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