Invention Grant
US08111205B1 Mast clamp current probe (MCCP) insertion loss determining methods and systems
有权
钳位电流探头(MCCP)插入损耗确定方法和系统
- Patent Title: Mast clamp current probe (MCCP) insertion loss determining methods and systems
- Patent Title (中): 钳位电流探头(MCCP)插入损耗确定方法和系统
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Application No.: US12407034Application Date: 2009-03-19
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Publication No.: US08111205B1Publication Date: 2012-02-07
- Inventor: Daniel W. S. Tam , James C. Logan , Shing Ted Li , Paul Michael McGinnis
- Applicant: Daniel W. S. Tam , James C. Logan , Shing Ted Li , Paul Michael McGinnis
- Applicant Address: US DC Washington
- Assignee: The United States of America as represented by the Secretary of the Navy
- Current Assignee: The United States of America as represented by the Secretary of the Navy
- Current Assignee Address: US DC Washington
- Agent Kyle Eppele; J. Eric Anderson
- Main IPC: H01Q7/08
- IPC: H01Q7/08

Abstract:
Methods and systems for determining insertion loss for a mast clamp current probe (MCCP) coupled to a monopole antenna are disclosed. An exemplary method includes determining a first power radiated by the monopole antenna across a first range of frequencies while driving the monopole antenna using a base-feed arrangement to produce a first power-frequency measurement, determining a second power radiated by the monopole antenna across the first range of frequencies while driving the monopole antenna using an MCCP-feed arrangement to produce a second power-frequency measurement and to determine impedance mismatch (MM), and determining insertion loss using the first power-frequency measurement, the second power-frequency measurement and the impedance mismatch.
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