Invention Grant
US08111402B2 Optical sensing based on overlapping optical modes in optical resonator sensors and interferometric sensors
有权
基于光学谐振器传感器和干涉测量传感器中重叠光学模式的光学感测
- Patent Title: Optical sensing based on overlapping optical modes in optical resonator sensors and interferometric sensors
- Patent Title (中): 基于光学谐振器传感器和干涉测量传感器中重叠光学模式的光学感测
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Application No.: US12418525Application Date: 2009-04-03
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Publication No.: US08111402B2Publication Date: 2012-02-07
- Inventor: Thanh M. Le , Nan Yu , Lutfollah Maleki , Anatoliy Savchenkov , William H. Steier
- Applicant: Thanh M. Le , Nan Yu , Lutfollah Maleki , Anatoliy Savchenkov , William H. Steier
- Applicant Address: US CA Pasadena US CA Pasadena US CA Los Angeles
- Assignee: OEwaves, Inc.,California Institute of Technology,University of Southern California
- Current Assignee: OEwaves, Inc.,California Institute of Technology,University of Southern California
- Current Assignee Address: US CA Pasadena US CA Pasadena US CA Los Angeles
- Agency: Perkins Coie LLP
- Main IPC: G01B9/02
- IPC: G01B9/02
Abstract:
Techniques and devices based on transverse magnetic (TM) and transverse electric (TE) modes in an optical resonator or interferometer to provide sensitive optical detection with insensitivity to a change in temperature. A shift in a difference between a first resonance wavelength of a TE optical mode and a second resonance wavelength of a TM optical mode is measured to measure a change in a sample that is in optical interaction with the optical resonator or interferometer. For example, the detected shift can be used to measure a change in a refractive index of the sample.
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