Invention Grant
US08111571B2 Semiconductor memory device 有权
半导体存储器件

Semiconductor memory device
Abstract:
A semiconductor memory device comprises a plurality of word lines, a plurality of bit lines intersecting the word lines, a memory cell array having a plurality of memory cell each provided at an intersection of the word line and the bit line, a plurality of sense amplifier each of which detects and amplifies a signal level of the bit line, a replica word line, a replica bit line intersecting the replica word line, a replica memory cell provided at each intersection of the replica word line and the replica bit line, a replica circuit which simulates reading out of the memory cell, and a timing generating circuit which quantizes a replica delay time that is a time until the replica bit line changes from a reference timing, and which generates an activation timing for the sense amplifier based on a quantization result.
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