Invention Grant
US08111580B2 Multi-phase duty-cycle corrected clock signal generator and memory having same 有权
多相占空比校正时钟信号发生器和具有相同功能的存储器

  • Patent Title: Multi-phase duty-cycle corrected clock signal generator and memory having same
  • Patent Title (中): 多相占空比校正时钟信号发生器和具有相同功能的存储器
  • Application No.: US13007307
    Application Date: 2011-01-14
  • Publication No.: US08111580B2
    Publication Date: 2012-02-07
  • Inventor: Yantao Ma
  • Applicant: Yantao Ma
  • Applicant Address: US ID Boise
  • Assignee: Micron Technology, Inc.
  • Current Assignee: Micron Technology, Inc.
  • Current Assignee Address: US ID Boise
  • Agency: Dorsey & Whitney LLP
  • Main IPC: G11C8/00
  • IPC: G11C8/00
Multi-phase duty-cycle corrected clock signal generator and memory having same
Abstract:
Memories, multi-phase clock signal generators, and methods for generating multi-phase duty cycle corrected clock signals are disclosed. For example, one such clock signal generator includes a delay-locked loop having a first multi-tap adjustable delay line configured to delay a reference signal to provide a plurality of clock signals having different phases relative to the reference clock signal. A periodic signal generated by the delay-locked loop is provided to a second multi-tap adjustable delay line as an input clock signal. Clock signals from taps of the second multi-tap adjustable delay line are provided as the multi-phase duty cycle corrected clock signals.
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