Invention Grant
- Patent Title: Phase error detection apparatus
- Patent Title (中): 相位误差检测装置
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Application No.: US11916401Application Date: 2006-05-30
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Publication No.: US08111596B2Publication Date: 2012-02-07
- Inventor: Mitsuru Sakai , Yoshihiro Kanda , Takashige Hiratsuka
- Applicant: Mitsuru Sakai , Yoshihiro Kanda , Takashige Hiratsuka
- Applicant Address: JP Osaka
- Assignee: Panasonic Corporation
- Current Assignee: Panasonic Corporation
- Current Assignee Address: JP Osaka
- Agency: Wenderoth, Lind & Ponack, L.L.P.
- Priority: JP2005-160962 20050601
- International Application: PCT/JP2006/310818 WO 20060530
- International Announcement: WO2006/129683 WO 20061207
- Main IPC: G11B7/09
- IPC: G11B7/09

Abstract:
A phase error detection apparatus capable of performing offset correction of a tracking error signal accurately even when there is a defect or a non-recorded position on an optical disc. There are provided a phase difference detection circuit (107) which receives two sequences of digital signals, performs phase comparison using a distance between zerocross points of the two sequences of digital signals, and outputs a phase comparison result PCR and a phase comparison completion signal PCC, and an offset control circuit (11) which outputs an offset correction amount for each phase comparison completion signal PCC from the phase difference detection circuit (107), and the offset correction amount Δα is added to the phase comparison result PCR to avoid offset correction in a position where phase comparison is not carried out.
Public/Granted literature
- US20090185468A1 PHASE ERROR DETECTION APPARATUS Public/Granted day:2009-07-23
Information query
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