Invention Grant
US08112681B2 Method and apparatus for handling fuse data for repairing faulty elements within an IC
有权
用于处理熔丝数据以修复IC内的故障元件的方法和装置
- Patent Title: Method and apparatus for handling fuse data for repairing faulty elements within an IC
- Patent Title (中): 用于处理熔丝数据以修复IC内的故障元件的方法和装置
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Application No.: US12010766Application Date: 2008-01-29
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Publication No.: US08112681B2Publication Date: 2012-02-07
- Inventor: Faisal Ramzan Ali Khoja , Gary Robert Waggoner , Sauro Landini , Ramamurti Chandramouli
- Applicant: Faisal Ramzan Ali Khoja , Gary Robert Waggoner , Sauro Landini , Ramamurti Chandramouli
- Applicant Address: GB Cambridge
- Assignee: ARM Limited
- Current Assignee: ARM Limited
- Current Assignee Address: GB Cambridge
- Agency: Nixon & Vanderhye P.C.
- Main IPC: G11C29/00
- IPC: G11C29/00 ; G11C17/18 ; G01R31/28

Abstract:
The application discloses an integrated circuit comprising: circuitry; a fusebox for storing an array of data identifying faulty elements within said circuitry; at least one fusebox controller for repairing said faulty elements in said circuitry in response to data received from said fusebox; a data communication path linking said fusebox controller with said fusebox; wherein said data stored in said fusebox is compacted data and said at least one fusebox controller comprises a data expander for expanding said compacted data received from said fusebox via said data communication path prior to repairing any faulty elements in said circuitry.
Public/Granted literature
- US20090190422A1 Electronic fuses Public/Granted day:2009-07-30
Information query