Apparatus and methods for effecting bad-block testing operations are disclosed herein. In some embodiments, instead of effecting bad-block testing for the majority of the flash memory blocks of a flash memory device during manufacture, most or all bad-block testing is postponed until the end user is in possession of the flash memory device. In some embodiments, after user data is received by the flash memory device from a host device, one or more blocks of the flash memory device are subjected to bad-block testing.