Invention Grant
- Patent Title: Process and apparatus for the measurement of thermal radiation using regular glass optics and short-wave infrared detectors
- Patent Title (中): 使用常规玻璃光学和短波红外探测器测量热辐射的方法和设备
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Application No.: US12472632Application Date: 2009-05-27
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Publication No.: US08119987B2Publication Date: 2012-02-21
- Inventor: Howard W. Yoon , George P. Eppeldauer
- Applicant: Howard W. Yoon , George P. Eppeldauer
- Agency: Absolute Technology Law Group, LLC
- Main IPC: G01J5/02
- IPC: G01J5/02
Abstract:
An infrared measurement apparatus and method to detect and view ambient-temperature objects using short-wave infrared (“SWIR”) detectors which operate in a wavelength region from 2.0 μm to 2.5 μm.
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