Invention Grant
- Patent Title: Semiconductor device and method for manufacturing the same
- Patent Title (中): 半导体装置及其制造方法
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Application No.: US12320571Application Date: 2009-01-29
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Publication No.: US08120085B2Publication Date: 2012-02-21
- Inventor: Shigeru Sugioka
- Applicant: Shigeru Sugioka
- Applicant Address: JP Tokyo
- Assignee: Elpida Memory, Inc.
- Current Assignee: Elpida Memory, Inc.
- Current Assignee Address: JP Tokyo
- Agency: McGinn IP Law Group, PLLC
- Priority: JP2008-019041 20080130
- Main IPC: H01L27/108
- IPC: H01L27/108

Abstract:
A semiconductor device includes: a channel region extending substantially perpendicular to a main surface of a semiconductor substrate; a first diffusion layer provided on a bottom of the channel region; a second diffusion layer provided on a top of the channel region; a first gate electrode that extends substantially perpendicular to the main surface of the semiconductor substrate and that is provided on a side of the channel region through a gate insulation film; and a second gate electrode that extends substantially parallel to the main surface of the semiconductor substrate and that is connected to the top of the first gate electrode, wherein a planar position of the second gate electrode is offset relative to a planar position of the first gate electrode.
Public/Granted literature
- US20090194814A1 Semiconductor device and method for manufacturing the same Public/Granted day:2009-08-06
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