Invention Grant
US08120867B2 Apparatus and methods of generating a test pattern of data, analysing a test pattern of data, and testing a data storage disk medium and/or a read/write head
有权
产生数据测试模式，分析数据测试模式以及测试数据存储盘介质和/或读/写头的装置和方法
- Patent Title: Apparatus and methods of generating a test pattern of data, analysing a test pattern of data, and testing a data storage disk medium and/or a read/write head
- Patent Title (中): 产生数据测试模式，分析数据测试模式以及测试数据存储盘介质和/或读/写头的装置和方法
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Application No.: US12600370Application Date: 2008-05-15
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Publication No.: US08120867B2Publication Date: 2012-02-21
- Inventor: Keith Rowland Charles Brady , Gregory Martin Quick , Paul Harvey Ronald Jolly
- Applicant: Keith Rowland Charles Brady , Gregory Martin Quick , Paul Harvey Ronald Jolly
- Applicant Address: GB Havant US CA Scotts Valley
- Assignee: Xyratex Technology Limited,Seagate Technology LLC
- Current Assignee: Xyratex Technology Limited,Seagate Technology LLC
- Current Assignee Address: GB Havant US CA Scotts Valley
- Agency: Pillsbury Winthrop Shaw Pittman LLP
- International Application: PCT/EP2008/055988 WO 20080515
- International Announcement: WO2008/142004 WO 20081127
- Main IPC: G11B27/36
- IPC: G11B27/36 ; G11B5/02
Abstract:
A method of generating a test pattern of data to be written to a data storage disk medium for testing includes: rotating the disk; detecting fluctuations in the speed of rotation of the disk; producing a reference clock signal in accordance with the fluctuations so as to be synchronized with the rotation of the disk; and, generating a test pattern of data using the reference clock signal as a timing reference. An apparatus for generating a test pattern of data includes a spindle for rotating a disk; a detector arranged to detect fluctuations in the speed of rotation of the disk; a processor arranged to produce a reference clock signal in accordance with fluctuations so as to be synchronized with the rotation of the disk; and, a pattern generator arranged to generate a test pattern of data using the reference clock signal as a timing reference.
Public/Granted literature
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