Invention Grant
US08122295B2 Memory systems and methods of detecting distribution of unstable memory cells
有权
检测不稳定记忆体细胞分布的记忆系统和方法
- Patent Title: Memory systems and methods of detecting distribution of unstable memory cells
- Patent Title (中): 检测不稳定记忆体细胞分布的记忆系统和方法
-
Application No.: US12774340Application Date: 2010-05-05
-
Publication No.: US08122295B2Publication Date: 2012-02-21
- Inventor: Seon-taek Kim , Yoon-young Kyung
- Applicant: Seon-taek Kim , Yoon-young Kyung
- Applicant Address: KR
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR
- Agency: Myers Bigel Sibley & Sajovec, P.A.
- Priority: KR10-2009-0094047 20091001
- Main IPC: G06F11/00
- IPC: G06F11/00

Abstract:
A circuit is operated to detect unstable memory cells from among a plurality of memory cells in at least one page. A determination is made from an initial status of data stored in a memory cell whether no read error occurs when the data is read at a standard read voltage level, whether a read error occurs and the read error is correctable, and whether a read error occurs and the read error is uncorrectable. Responsive to determining that a read error occurs that is correctable, a further determination is made as to whether the memory cell is correctable by reading the data stored in the memory cell at a correction read voltage level, which has a different voltage level from the standard read voltage level, and by determining whether a read error occurring in the data read at the correction read voltage level is correctable or uncorrectable.
Public/Granted literature
- US20110083039A1 MEMORY SYSTEMS AND METHODS OF DETECTING DISTRIBUTION OF UNSTABLE MEMORY CELLS Public/Granted day:2011-04-07
Information query