Invention Grant
- Patent Title: Method of forming an interconnect joint
- Patent Title (中): 形成互连接头的方法
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Application No.: US12837574Application Date: 2010-07-16
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Publication No.: US08124517B2Publication Date: 2012-02-28
- Inventor: Lakshmi Supriya , Daewoong Suh
- Applicant: Lakshmi Supriya , Daewoong Suh
- Applicant Address: US CA Santa Clara
- Assignee: Intel Corporation
- Current Assignee: Intel Corporation
- Current Assignee Address: US CA Santa Clara
- Agent Kenneth A. Nelson
- Main IPC: H01L21/44
- IPC: H01L21/44

Abstract:
A method of forming an interconnect joint includes providing a first metal layer (210, 310), providing a film (220, 320) including metal particles (221, 321) and organic molecules (222, 322), placing the film over the first metal layer, placing a second metal layer (230, 330) over the film, and sintering the metal particles such that the organic molecules degrade and the first metal layer and the second metal layer are joined together.
Public/Granted literature
- US20100276474A1 METHOD OF FORMING AN INTERCONNECT JOINT Public/Granted day:2010-11-04
Information query
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