Invention Grant
US08125054B2 Semiconductor device having enhanced scribe and method for fabrication
有权
具有增强的划片和制造方法的半导体器件
- Patent Title: Semiconductor device having enhanced scribe and method for fabrication
- Patent Title (中): 具有增强的划片和制造方法的半导体器件
-
Application No.: US12565748Application Date: 2009-09-23
-
Publication No.: US08125054B2Publication Date: 2012-02-28
- Inventor: Jeffrey Alan West , Craig Beddingfield
- Applicant: Jeffrey Alan West , Craig Beddingfield
- Applicant Address: US TX Dallas
- Assignee: Texas Instruments Incorporated
- Current Assignee: Texas Instruments Incorporated
- Current Assignee Address: US TX Dallas
- Agent Jacqueline J. Garner; Wade J. Brady, III; Frederick J. Telecky, Jr.
- Main IPC: H01L23/544
- IPC: H01L23/544 ; H01L21/00

Abstract:
In a semiconductor device for use in a wafer level chip scale package (WLCSP) and a method for fabrication, an inner scribe seal is formed around a functional circuit area that does not extend all the way into the corners of the rectangular die, and an outer scribe seal follows the perimeter of the die and into the corners, with the outer scribe seal having a continuous barrier wall towards the die edges so that moisture penetration in dielectric layers of the die is minimized, and cracks and delamination are stopped near the die edges. Limiting the extent of the insulating layer or layers in the WLCSP to cover the functional circuit area also reduces the stresses caused by these layers near the die corners.
Public/Granted literature
- US20100078769A1 ENVIRONMENTAL DIE SEAL ENHANCEMENT FOR WAFER LEVEL CHIP SCALE PACKAGES Public/Granted day:2010-04-01
Information query
IPC分类: