Invention Grant
US08125221B2 Method and device for measuring an angle at which a magnetic field is aligned in a plane relative to a reference axis 有权
用于测量磁场在相对于参考轴的平面中对准的角度的方法和装置

  • Patent Title: Method and device for measuring an angle at which a magnetic field is aligned in a plane relative to a reference axis
  • Patent Title (中): 用于测量磁场在相对于参考轴的平面中对准的角度的方法和装置
  • Application No.: US12533350
    Application Date: 2009-07-31
  • Publication No.: US08125221B2
    Publication Date: 2012-02-28
  • Inventor: David Muthers
  • Applicant: David Muthers
  • Applicant Address: DE Freiburg I.BR.
  • Assignee: Micronas GmbH
  • Current Assignee: Micronas GmbH
  • Current Assignee Address: DE Freiburg I.BR.
  • Agency: Muncy, Geissler, Olds & Lowe, PLLC
  • Priority: EP08013832 20080801
  • Main IPC: G01R33/02
  • IPC: G01R33/02
Method and device for measuring an angle at which a magnetic field is aligned in a plane relative to a reference axis
Abstract:
A device for measuring an angle at which a magnetic field is aligned in a plane relative to a reference axis has at least two magnetic field sensors, which are aligned with their measurement axes in and/or parallel to the plane and oriented at right angles to each other. The device has a PLL phase control circuit with a follow-on oscillator arranged in a phase control loop, which has at least one oscillator output for a digital oscillating signal. The magnetic field sensors are coupled to the phase control loop in such a way that the digital oscillating signal is phase synchronous with a rotation scanning signal formed by rotary scanning of the measurement signals of the magnetic field sensors. The oscillator output is connected to a phasing detector for determining the phasing of the digital oscillating signal.
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