Invention Grant
- Patent Title: Method and device for measuring an angle at which a magnetic field is aligned in a plane relative to a reference axis
- Patent Title (中): 用于测量磁场在相对于参考轴的平面中对准的角度的方法和装置
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Application No.: US12533350Application Date: 2009-07-31
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Publication No.: US08125221B2Publication Date: 2012-02-28
- Inventor: David Muthers
- Applicant: David Muthers
- Applicant Address: DE Freiburg I.BR.
- Assignee: Micronas GmbH
- Current Assignee: Micronas GmbH
- Current Assignee Address: DE Freiburg I.BR.
- Agency: Muncy, Geissler, Olds & Lowe, PLLC
- Priority: EP08013832 20080801
- Main IPC: G01R33/02
- IPC: G01R33/02

Abstract:
A device for measuring an angle at which a magnetic field is aligned in a plane relative to a reference axis has at least two magnetic field sensors, which are aligned with their measurement axes in and/or parallel to the plane and oriented at right angles to each other. The device has a PLL phase control circuit with a follow-on oscillator arranged in a phase control loop, which has at least one oscillator output for a digital oscillating signal. The magnetic field sensors are coupled to the phase control loop in such a way that the digital oscillating signal is phase synchronous with a rotation scanning signal formed by rotary scanning of the measurement signals of the magnetic field sensors. The oscillator output is connected to a phasing detector for determining the phasing of the digital oscillating signal.
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