Invention Grant
- Patent Title: Abnormality detecting apparatus
- Patent Title (中): 异常检测装置
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Application No.: US12412184Application Date: 2009-03-26
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Publication No.: US08125336B2Publication Date: 2012-02-28
- Inventor: Kiyokazu Ieda , Yuichi Murakami , Hiroki Okada
- Applicant: Kiyokazu Ieda , Yuichi Murakami , Hiroki Okada
- Applicant Address: JP Kariya-Shi, Aichi-Ken
- Assignee: Aisin Seiki Kabushiki Kaisha
- Current Assignee: Aisin Seiki Kabushiki Kaisha
- Current Assignee Address: JP Kariya-Shi, Aichi-Ken
- Agency: Buchanan, Ingersoll & Rooney PC
- Priority: JP2008-103870 20080411
- Main IPC: G08B13/18
- IPC: G08B13/18

Abstract:
An abnormality detecting apparatus includes a power supply portion applying a voltage to electrodes provided at both surfaces of a light control glass adapted to be provided at a vehicle to change a transparency of the light control glass, a detection portion detecting a detectable amount obtained on the basis of the voltage applied to the electrodes, and an abnormality determination portion determining whether or not an abnormality occurs to the light control glass based on a predetermined detectable amount and the detectable amount detected by the detection portion.
Public/Granted literature
- US20090256704A1 ABNORMALITY DETECTING APPARATUS Public/Granted day:2009-10-15
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