Invention Grant
- Patent Title: Testing method of an IC card including a ZigBee device
- Patent Title (中): 包括ZigBee设备的IC卡的测试方法
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Application No.: US12412931Application Date: 2009-03-27
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Publication No.: US08125913B2Publication Date: 2012-02-28
- Inventor: Raffaele Longo
- Applicant: Raffaele Longo
- Applicant Address: CH Geneva
- Assignee: Incard S.A.
- Current Assignee: Incard S.A.
- Current Assignee Address: CH Geneva
- Agency: Allen, Dyer, Doppelt, Milbrath & Gilchrist, P.A.
- Priority: ITM12008A0533 20080328
- Main IPC: G06F11/00
- IPC: G06F11/00

Abstract:
A method for testing a ZigBee device included in an IC Card includes associating a predetermined Personal Area Network (PAN) Identifier to the ZigBee device, and providing a test device, for initializing a ZigBee network. The method may include connecting the ZigBee device to the ZigBee network and transmitting the corresponding PAN Identifier to the test device. The method may include returning a fault message, indicative of a failure of connecting and transmitting, if the test device does not receive the PAN Identifier. The predetermined PAN Identifier may be stored in a memory portion of the test device and include, in the fault message, the PAN Identifier if the test device does not receive the PAN Identifier, in order to identify the ZigBee device as a defective device.
Public/Granted literature
- US20090303885A1 TESTING METHOD OF AN IC CARD INCLUDING A ZIGBEE DEVICE Public/Granted day:2009-12-10
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