Invention Grant
US08125913B2 Testing method of an IC card including a ZigBee device 有权
包括ZigBee设备的IC卡的测试方法

Testing method of an IC card including a ZigBee device
Abstract:
A method for testing a ZigBee device included in an IC Card includes associating a predetermined Personal Area Network (PAN) Identifier to the ZigBee device, and providing a test device, for initializing a ZigBee network. The method may include connecting the ZigBee device to the ZigBee network and transmitting the corresponding PAN Identifier to the test device. The method may include returning a fault message, indicative of a failure of connecting and transmitting, if the test device does not receive the PAN Identifier. The predetermined PAN Identifier may be stored in a memory portion of the test device and include, in the fault message, the PAN Identifier if the test device does not receive the PAN Identifier, in order to identify the ZigBee device as a defective device.
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