Invention Grant
- Patent Title: Pressurized detectors substance analyzer
- Patent Title (中): 加压检测器物质分析仪
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Application No.: US12692115Application Date: 2010-01-22
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Publication No.: US08128874B2Publication Date: 2012-03-06
- Inventor: Eric T. Heggs , Edward K. Price , Stephen R. Proffitt
- Applicant: Eric T. Heggs , Edward K. Price , Stephen R. Proffitt
- Applicant Address: US CA Thousand Oaks
- Assignee: Teledyne Instruments, Inc.
- Current Assignee: Teledyne Instruments, Inc.
- Current Assignee Address: US CA Thousand Oaks
- Agency: K&L Gates LLP
- Main IPC: G01N7/00
- IPC: G01N7/00

Abstract:
A method to measure the concentration of a constituent element in a gas sample contained in an analyzer. A sample cell of a detector has an inlet and an outlet. The outlet of the sample cell is sealed. A predetermined mass of a gas sample is received through the inlet into the sample cell over a predetermined pressurization period until substantially the entire mass of the gas sample contained in the analyzer is contained within the sample cell. The gas sample is pressurized to a predetermined pressure over the pressurization period. A concentration of a constituent element in the pressurized gas sample is determined.
Public/Granted literature
- US20100116027A1 PRESSURIZED DETECTORS SUBSTANCE ANALYZER Public/Granted day:2010-05-13
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