Invention Grant
- Patent Title: Automated analyzer
- Patent Title (中): 自动分析仪
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Application No.: US12200387Application Date: 2008-08-28
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Publication No.: US08128891B2Publication Date: 2012-03-06
- Inventor: Katsuaki Takahashi
- Applicant: Katsuaki Takahashi
- Applicant Address: JP Tokyo
- Assignee: Hitachi High-Technologies Corporation
- Current Assignee: Hitachi High-Technologies Corporation
- Current Assignee Address: JP Tokyo
- Agency: Mattingly & Malur, PC
- Priority: JP2007-224995 20070831
- Main IPC: B01L3/00
- IPC: B01L3/00

Abstract:
An automated analyzer includes pipetting means for discharging a sample and reagent into an empty reaction vessel without causing contact to occur between the leading end of a sample probe and the bottom of the reaction vessel. The sample probe is inserted into the reaction vessel and then stopped when a bottom end of an outer pipe of the sample probe comes in contact with the top edge of the reaction vessel to maintain a fixed gap between the leading end of an inner pipe of the sample probe and the bottom of the reaction vessel. Further, an insulating material is disposed between the inner and outer pipes of the sample probe.
Public/Granted literature
- US20090060784A1 AUTOMATED ANALYZER Public/Granted day:2009-03-05
Information query
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