Invention Grant
US08129956B2 Method for measuring a temperature in an electronic device having a battery and a memory device
有权
用于测量具有电池和存储器件的电子设备中的温度的方法
- Patent Title: Method for measuring a temperature in an electronic device having a battery and a memory device
- Patent Title (中): 用于测量具有电池和存储器件的电子设备中的温度的方法
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Application No.: US12910287Application Date: 2010-10-22
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Publication No.: US08129956B2Publication Date: 2012-03-06
- Inventor: Simon J. Lovett
- Applicant: Simon J. Lovett
- Applicant Address: US NY Mt. Kisco
- Assignee: Round Rock Research, LLC
- Current Assignee: Round Rock Research, LLC
- Current Assignee Address: US NY Mt. Kisco
- Agency: Lerner, David, Littenberg, Krumholz & Mentlik LLP
- Main IPC: H01M10/44
- IPC: H01M10/44

Abstract:
A temperature sensing device can be embedded in a memory circuit in order to sense the temperature of the memory circuit. One oscillator generates a temperature variable signal that increases frequency as the temperature of the oscillator increases and decreases frequency when the temperature of the oscillator decreases. A temperature invariant oscillator generates a fixed width signal that is controlled by an oscillator read logic and indicates a temperature sense cycle. An n-bit counter is clocked by the temperature variable signal while the fixed width signal enables/inhibits the counter. The faster the counter counts, the larger the count value at the end of the sense cycle indicated by the fixed width signal. A larger count value indicates a warmer temperature. A smaller count value indicates a colder temperature.
Public/Granted literature
- US20110037437A1 METHOD FOR MEASURING A TEMPERATURE IN AN ELECTRONIC DEVICE HAVING A BATTERY Public/Granted day:2011-02-17
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