Invention Grant
- Patent Title: Push-button testing system
- Patent Title (中): 按钮测试系统
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Application No.: US12946510Application Date: 2010-11-15
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Publication No.: US08130073B2Publication Date: 2012-03-06
- Inventor: Adrian Baima
- Applicant: Adrian Baima
- Applicant Address: US CA Northridge
- Assignee: Harman International Industries, Incorporated
- Current Assignee: Harman International Industries, Incorporated
- Current Assignee Address: US CA Northridge
- Agency: The Eclipse Group LLP
- Main IPC: H01C10/10
- IPC: H01C10/10

Abstract:
A push-button switch test device having a flexible tab fixedly attached to a pushing member. The flexible tab is made of a flexible material and includes a deformation sensitive resistor mounted on a surface. The push-button switch test device may be used to test a push-button by imposing a known force on the flexible tab while receiving a signal level across the deformation sensitive resistor. As the known force pushes on the flexible tab, the signal level indicates when the push-button has engaged. The force may then be reversed to permit sensing of the disengagement of the switch. Configurations of a plurality of push-button switch test devices may be arranged in a test frame that mirrors a configuration of push-button switches.
Public/Granted literature
- US20110057657A1 PUSH-BUTTON TESTING SYSTEM Public/Granted day:2011-03-10
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