Invention Grant
- Patent Title: High-resolution, active-optic X-ray fluorescence analyzer
- Patent Title (中): 高分辨率,主动式X射线荧光分析仪
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Application No.: US11831518Application Date: 2007-07-31
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Publication No.: US08130902B2Publication Date: 2012-03-06
- Inventor: Bernhard W. Adams , Klaus Attenkofer , Oliver A. Schmidt
- Applicant: Bernhard W. Adams , Klaus Attenkofer , Oliver A. Schmidt
- Applicant Address: US IL Chicago
- Assignee: UChicago Argonne, LLC
- Current Assignee: UChicago Argonne, LLC
- Current Assignee Address: US IL Chicago
- Agent Joan Pennington
- Main IPC: G01N23/223
- IPC: G01N23/223

Abstract:
Active optics apparatus and method for aligning active optics are provided for a high-resolution, active optic fluorescence analyzer combining a large acceptance solid angle with wide energy tunability. A plurality of rows of correctors selectively controlled to bend an elongated strip of single crystal material like Si (400) into substantially any precisely defined shape. A pair of pushers engages opposite ends of the silicon crystal strip exert only a force along the long axis of the crystal strip, and does not induce additional bending moments which would result in a torsion of the crystal.
Public/Granted literature
- US20100027740A1 HIGH-RESOLUTION, ACTIVE-OPTIC X-RAY FLUORESCENCE ANALYZER Public/Granted day:2010-02-04
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